DETECTION IN THE VACUUM ULTRAVIOLET.HUNTER WR.1976; ELECTRO-OPT. SYST. DESIGN; U.S.A.; DA. 1976; VOL. 8; NO 7; PP. 44-46; BIBL. 7 REF.Article

EFFECTS OF DETECTOR NON-LINEARITY ON CALIBRATION AND DATE REDUCTION OF ROTATING-ANALYSER ELLIPSOMETERS.HUNTER WR.1976; J. OPT. SOC. AMER.; U.S.A.; DA. 1976; VOL. 66; NO 2; PP. 94-97; BIBL. 12 REF.Article

ON-BLAZE SCANNING MONOCHROMATOR FOR THE VACUUM ULTRAVIOLETHUNTER WR.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 9; PP. 1634-1642; BIBL. 11 REF.Article

OPTICAL CONTAMINATION: ITS PREVENTION IN XUV SPECTROGRAPHS FLOWN BY THE U.S. NAVAL RESEARCH LABORATORY IN THE APOLLO TELESCOPE MOUNT.HUNTER WR.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 4; PP. 909-916; BIBL. 11 REF.Article

MEASUREMENT OF OPTICAL PROPERTIES OF MATERIALS IN THE VACUUM ULTRAVIOLET SPECTRAL REGIONHUNTER WR.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 12; PP. 2103-2114; BIBL. 53 REF.Article

ULTRAVIOLETHUNTER WR.1979; ELECTRO-OPT. SYST. DESIGN; USA; DA. 1979; VOL. 11; NO 9; PP. 72-74Article

PREPARATION AND TESTING OF REFLECTANCE COATINGS FOR DIFFRACTION GRATINGS IN THE EXTREME ULTRAVIOLETHUNTER WR.1980; PHYS. THIN FILMS; ISSN 0079-1970; USA; DA. 1980; VOL. 11; PP. 1-34; BIBL. 21 REF.Article

DESIGN CRITERIA FOR REFLECTION POLARIZERS AND ANALYZERS IN THE VACUUM ULTRAVIOLET.HUNTER WR.1978; APPL. OPT.; U.S.A.; DA. 1978; VOL. 17; NO 8; PP. 1259-1270; BIBL. 26 REF.Article

STATUS OF THE EXTREME UV TECHNOLOGY.HUNTER WR.1976; ELECTRO-OPT. SYST. DESIGN; U.S.A.; DA. 1976; VOL. 8; NO 1; PP. 18-19; BIBL. 4 REF.Article

VARIATION OF BLAZE OF CONCAVE DIFFRACTION GRATINGSHUTLEY MC; HUNTER WR.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 2; PP. 245-250; BIBL. 5 REF.Article

OPTICAL AND PHYSICAL PROPERTIES OF DIFFRACTION GRATINGS FOR THE V.U.V. AND SOFT X-RAY REGIONNAMIOKA T; HUNTER WR.1978; J. PHYS., COLLOQ.; FRA; DA. 1978; VOL. 39; NO 4; PP. 167-187; ABS. FRE; BIBL. 60 REF.Conference Paper

REFLECTION POLARIZERS FOR THE VACUUM ULTRAVIOLET USING AL+MGF₂ MIRRORS AND AN MGF₂ PLATE.HASS G; HUNTER WR.1978; APPL. OPT.; U.S.A.; DA. 1978; VOL. 17; NO 1; PP. 76-82; BIBL. 28 REF.Article

THIN ALUMINUM FILTERS FOR USE ON THE APOLLO TELESCOPE MOUNT XUV SPECTROGRAPHS.SCHUMACHER RJ; HUNTER WR.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 4; PP. 904-908; BIBL. 7 REF.Article

THE USE OF EVAPORATED FILMS FOR SPACE APPLICATIONS. EXTREME ULTRAVIOLET ASTRONOMY AND TEMPERATURE CONTROL OF SATELLITESHASS G; HUNTER WR.1978; PHYS. THIN FILMS; USA; DA. 1978; VOL. 10; PP. 71-166; BIBL. 3 P.Article

EFFECT OF DIFFUSION PUMPS OIL CONTAMINATION ON DIFFRACTION GRATING EFFICIENCY IN THE VUV SPECTRAL REGIONHUNTER WR; ANGEL DW.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 20; PP. 3506-3509; BIBL. 4 REF.Article

THICKNESS OF ABSORBING FILMS NECESSARY TO MEASURE THEIR OPTICAL CONSTANTS USING THE REFLECTANCE-VS-ANGLE-OF-INCIDENCE METHOD.HUNTER WR; HASS G.1974; J. OPT. SOC. AMER.; U.S.A.; DA. 1974; VOL. 64; NO 4; PP. 429-433; BIBL. 15 REF.Article

REFLECTANCE OF EVAPORATED RUTHENIUM FILMS FROM 300 A TO 50 MU M = REFLECTANCE DE COUCHES DE RUTHENIUM EVAPORE DE 300 A A 50 MU MHASS G; HUNTER WR.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 14; PP. 2334-2335; BIBL. 11 REF.Article

ANALYSIS OF THE CHANGES IN EFFICIENCY ACROSS THE RULED AREA OF A CONCAVE DIFFRACTION GRATINGNEVIERE M; HUNTER WR.1980; APPL. OPT.; USA; DA. 1980; VOL. 19; NO 12; PP. 2059-2065; BIBL. 12 REF.Article

MEASURING CONCAVE DIFFRACTION GRATING EFFICIENCIES AT GRAZING INCIDENCE.HUNTER WR; PRINZ DK.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 12; PP. 3171-3175; BIBL. 3 REF.Article

ADJUSTABLE APERTURE STOP TO CONTROL THE DIVERGENCE AND ORIENTATION OF THE BEAM EMERGING FROM A VACUUM ULTRAVIOLET MONOCHROMATOR.HUNTER WR; CHAIMSON RK.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 12; PP. 2913-2918; BIBL. 4 REF.Article

TRANSMITTANCE OF CULTURED CRYSTALLINE QUARTZ IN THE VACUUM ULTRAVIOLET BEFORE AND AFTER ELECTRON IRRADIATIONHASS G; HUNTER WR.1978; APPL. OPT.; USA; DA. 1978; VOL. 17; NO 15; PP. 2310-2315; BIBL. 9 REF.Article

CLEANING OF CONTAMINATED CHANNEL ELECTRON MULTIPLIER ARRAYSHARLOW FE; HUNTER WR.1972; APPL. OPT.; U.S.A.; DA. 1972; VOL. 11; NO 11; PP. 2719-2720; BIBL. 8 REF.Serial Issue

REFLECTANCE AND PREPARATION OF FRONT SURFACE MIRRORS FOR USE AT VARIOUS ANGLES OF INCIDENCE FROM THE ULTRAVIOLET TO THE FAR INFRAREDHASS G; HEANEY JB; HUNTER WR et al.1982; PHYSICS OF THIN FILMS; ISSN 0079-1970; USA; DA. 1982; VOL. 12; PP. 1-51; BIBL. 81 REF.Article

A TRANSMISSION LINE MODEL FOR SILICIDED DIFFUSIONS: IMPACT ON THE PERFORMANCE OF VLSI CIRCUITSSCOTT DB; HUNTER WR; SHICHIJO H et al.1982; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 4; PP. 651-661; BIBL. 23 REF.Article

MULTIPLATE RESONANT REFLECTORS FOR THE VACUUM ULTRAVIOLETHUNTER WR; HUTCHINSON MHR; JONES MRO et al.1981; APPL. OPT.; ISSN 0003-6935; USA; DA. 1981; VOL. 20; NO 5; PP. 770-772; BIBL. 8 REF.Article